Low temperature mechanical losses of oscillators fabricated in silicon wafers
- Document #:
- LIGO-G1400207-v1
- Document type:
- G - Presentations (eg Graphics)
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- Abstract:
- We present results of measurements of dissipation in silicon oscillators fabricated on the base of standard silicon wafers using anisotropic chemical wet etching. The measurements were carried out in the temperature range from room to liquid nitrogen temperature. Results and future plans are discussed.
- Files in Document:
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- LIGO-G1400207.pdf (4.7 MB)
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